Partial secondary electron-yield NEXAFS spectromicroscopy with an energy-filtered X-PEEM

نویسندگان

  • Stephen Lynd Christensen
  • Brian M. Haines
  • Uday D. Lanke
  • Matthew F. Paige
  • Stephen G. Urquhart
چکیده

This issue of the IBM journal describes recent advances in the field of nanoscience, with an emphasis on cathode lens-based microscopy methods, including LEEM (low-energy electron microscopy), PEEM (photoemission electron microscopy), and other related analytical approaches. Papers highlight scientific advances and instrumental developments on topics that include thin films, organic films, surface chemistry, magnetism, time-resolved methods, and various novel applications of microscopy in material science.

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عنوان ژورنال:
  • IBM Journal of Research and Development

دوره 55  شماره 

صفحات  -

تاریخ انتشار 2011